Yes, but circuit behavior changes due to increased C. See the comments in
the ap note links you provided. You could consider using sampling approach
to problem looking at one diode at a time thru a mux. That would take careful
design as it intrinsically adds noise into the problem. Sampling on the order
of > 1 x N MSPS could be a starting point.
Or use a discrete buffer for each diode, maybe a SS JFET buffer might be
an approach.
Regards, Dana.