So, AlphZeta, we are definitely in agreement!
If you read my previous messages
carefully, you will see that this is the very reason why I
did not use the adverb "exactly" to emphasize the adjective "same," which characterises the degree of resemblance of the two --not so different, after all-- designs, in my second point regarding
the measuring principles. Let me quote the passage in question:
[...] by putting the JYE and the ELM schematics side by side makes clear that it is the same exactly design, based on the same measuring principle and implemented using the same exactly biasing technique as well as the same exactly critical component values -not to mention the same exactly displaying method and format... [...]
(Emphasis in mine)
What about my other four (4) indisputable points that indicate plagiarism of the ChaN's design by a third party? I am quite certain that if someone disassembles both the binaries of the two devices will find all the proofs he will ever need to support such a claim. But I am not the one who will do it.
Well, let's examine this, rationally: Yes, we can both begin designing a capacitance meter, from scratch. It is very possible that both of us will choose to use the same measuring principle. It is alright! It is also possible to also implement it using the same biasing technique; but it will be very unlikely to use the same exactly biasing component values. Of course, it will be a definite indication of one copying the work of the other if we both end up using not only the same display but the same also displaying format (four digits to display three floating point arithmetic characters for the measured value plus one alphanumeric character for the range). No! This screams that it is NOT a coincidence...
Please, read carefully what I have posted at my previous message about "Coincidence." Do not forget that, every coin has two faces: If someone can talk about
Conspiracy Theories, someone else would rightfully point at the other side of the same subject matter, talking of
Coincidence Theories! A critical thinking test, now: Why, really, are we constantly listening
from authoritative sources about the first of the two previous phrases and NEVER ever about the second one? You can read
something really interesting I wrote about that, a few years ago in another EE discussions board.
-George