Singular measurement samples will have too big an error, as the noise / standard deviation in Ohm mode is at least 0.2ppm of range.

Therefore it's mandatory to invoke the statistics function for measurements.

By measuring the StD also, you will have control over possible erroneous measurements, as can happen easily by external disturbance. If you observe an excessive StD value, just skip the measurement.

With these above settings, take 16 readings and use mean value for the Ohm value, and the StD value as its uncertainty value (plus calibration uncertainty, of course).

The setting for my 10k resistors and cabling, and the 'workflow' for taking measurements is therefore:

OHMF

RANGE 10000

NDIG 8

OCOMP ON

DELAY 1

APER 1

NRDGS 16

TRIG HOLD

MATH STAT

TRIG SGL or TRIG

=>

RMATH NSAMP

RMATH MEAN

RMATH SDEV

I have stored the settings in the first block to a State, to be accessed by e.g. RSTATE 2, and the MATH functions are assigned to several Keys, copied that configuration from the FLUKE 3458A/HFL.

A single measurement then lasts about one minute.

Once configured that way, you can easily repeat the measurement, or measure the next resistor by pressing

MATH STAT

TRIG

PS:

MATH NULL is not recommended, because OCOMP and 4W function already compensate NULL errors. Additionally, for using NULL, you would have to change the cabling configuration and would probably subtract a residual Offset which has nothing to do with your 10k DUT.

Also, MATH NULL will delete the STAT function, and it's difficult to invoke both functions in a logically correct manner.

Frank