Hi
I'm working on a script for the HP3577 to make accurate impeadance measurments over frequency according to this document:
http://literature.cdn.keysight.com/litweb/pdf/5990-5902EN.pdfIn particular, I recreated the setup from page 29 (shunt-thru), with the instrument set to HighZ inputs on R and A (same as R and T as laid out in the Keysight document above).
The measurements I get from my python script seem are fairly accurate without cal, however, I would like to do open / short / load calibration as the document states.
By performing the
3-term calibration (OPEN/SHORT/
LOAD calibration) in the impedance
domain, the measurement system is
fully adjusted at the measurement
I found some information on the calibration methods used when doing vna s-parameter measurements. But I could not find anything specific to impedance measurements. So I would love to be pointed to a reference to read up on the topic.
So far I came up with this. In the ideal case the measurements should be:
If the DUT is open: Vt ~ Vr ~Usource (because the input impedance of R and T >> Ri and >> 50Ohms)
If the DUT is short: Vt = 0 and Vr = Usource * Ri / (50+Ri)
If the DUT is loaded with Rload: Vt = Usource * Rload / (Rload + Ri + 50) and VR = Usource * (Ri + Rload) / (Ri + Rload + 50)
This looks like some sort of optimization problem to me...(?)
In addition I would first have to measure the Ri(f) and Rload(f) of course to get rid of that error as well. However the Usource might still vary and introduce an error.
As I said, any sources or documents or other inputs would be appreciated.
Thanks a lot!
EDIT: - Apparently it is called OSL calibration
- The usual spelling mistakes
UPDATE:- Following papers on the topic are rather helpful: