Author Topic: EMC test of a component/sub-assembly  (Read 170 times)

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Offline metebalciTopic starter

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EMC test of a component/sub-assembly
« on: February 22, 2024, 07:00:04 am »
If the DUT is a component/sub-assembly (may have no enclosure), which cannot work alone or probably cannot even be powered on independently, how is the test done ? Is it somehow connected by wires to the host device staying outside ? But what happens if there is a not very long max length limit ? Also when the DUT is somehow configurable/programmable, how is the configuration/program selected, is it the one using all the hardware resources at max capacity etc. ?

Some examples I can think of. A PC/PCIe card, a PXI module, a eurorack (synth) module, an eval kit (mcu, fpga etc.), an expansion board for something (like an rpi or fpga board).
 


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