No, it IS true of DRAM. DRAM bits are capacitors. When a row is selected, the charge on the capacitors is sent to sense amps for reading. In the process, the charge is partially depleted. As part of the read cycle, the cell read must also refreshed. This can happen during the same row selection as the read. Essentially, the sense amp determines the state of the cells and then transistors on columns turn on to push the voltages back up in the appropriate columns.
This is independent of the bulk refresh cycle periodically applied to the whole DRAM.
Step "7" in the operation section here describes badly how this works:
http://en.wikipedia.org/wiki/Dynamic_random-access_memorySlide 4 of this deck from some Stanford EE class also describes it:
http://www-inst.eecs.berkeley.edu/~cs150/fa04/Lecture/lec16.ppt[/quote]
Read those two steps carefully. They agree with what I said. The cell's contents are never lost at any point in the read cycle. If the refresh step at the end of the cycle were skipped the cells would still be readable a number of times before the cell's contents were lost. This is fundamentally different from reading core stores, or something more modern like FRAM. These don't weaken the cell's state during a read, they completely destroy it. With these memories a read cycle is inherently longer than a write cycle, as a user level read operation is actually a read cycle followed by a write cycle.