Author Topic: Extreme failure analysis methods for a CPU - gamersnexus  (Read 407 times)

0 Members and 1 Guest are viewing this topic.

Offline thm_wTopic starter

  • Super Contributor
  • ***
  • Posts: 7527
  • Country: ca
  • Non-expert
Extreme failure analysis methods for a CPU - gamersnexus
« on: May 11, 2023, 09:44:21 pm »


TLDR of original issue:
- motherboard overvolted the CPU, likely causing a runaway failure and burning the silicon. Overcurrent protection did not trigger.

This video is the follow up showing some interesting tools they used to inspect the CPU:
- Microscope
- Cross-section + microscope
- 3D CT scan
- Scanning acoustic microscope (SAM)
- Scanning electron microscope (SEM)
- Energy dispersive Xray (EDXA)

The tools and methods are the interesting part, the results not as much, basically "yeah it burned". But in other cases, or with more detail of the die, could probably pinpoint where exactly the failure occurred.
Profile -> Modify profile -> Look and Layout ->  Don't show users' signatures
 
The following users thanked this post: tom66


Share me

Digg  Facebook  SlashDot  Delicious  Technorati  Twitter  Google  Yahoo
Smf