I am working on making test applications on ATE / "Automated Test Environment" machines and we get a lot of projects involving automotive electronics.
On most of these projects the measurement of standby current consumption is essential and it's very important for our customers to ensure a correct standby current.
So I have pretty much taken the µCurrent design and changed it to fit my own needs.
I plan to change the shunt depending on the actual application / the current that I want to measure.
Amplification is x100 like the µCurrent and output voltage should be in the 1V range so that the 1V range of my voltmeter can be used.
- First of all the output voltage should be ground referenced, thus a charge pump for generating negative OP amp supply is needed.
- I also changed the OP-Amp to one that's easier to source for me and still offers quite good specs. I also don't need very high precision because we just need to ensure that the standby current consumption is "about right". It's more important to have reproducible measurements.
- I also don't need multiple ranges. For high currents (active current of the DUT / "Device Under Test") i can just read the power supply.
I just need a circuit that helps to measure currents in the 1 to 100 uA range. - I also added a "burden voltage limiter", basically a shunt regulator limiting the burden voltage to something of about 20mV regardless of the current.
I attached my circuit here and want to bring that last addition to your attention.
Most loads (e.g. a microcontroller circuit) have high dynamic range current consumption.
The load might stay in standby mode for most of the time, drawing only little current.
From time to time the load will wake up and do something that consumes a lot more current.
Now if the µCurrent is set to 1250nA range (10k shunt resistor) then the load won't be able to wake up properly because the 10k shunt resistor is limiting the current to the load. And even if the circuit can wake up, the increased current draw of the load will cause the load voltage to drop.
For that reason i added that "burden voltage limiter". As soon as the burden voltage increases to something above 20mV the MOSFET will turn on and ensure that the load voltage won't drop.
This way you also don't have to worry about setting the correct current range.
Though I am unsure of how much this will affect the actual measurement.
I guess the OP-Amp IC4 in my circuit will have some small input current and the OFF-state resistance / leakage current of Q1 will also cause some error.
What do you think, does this circuit make sense?
How big is the error introduced due to that circuit? Any ideas to reduce the error? Maybe I can make a better choice of components for this?
Can this be a possible addition to the next µCurrent? If the effect on the measurement is too big it can be made so, that it can be switched on / off.