Yeah, as above, I suggest doing measurements with a very significant number of LUTs/DSP blocks/BRAM blocks/etc to make your measurements relevant, and make negligible the fact a few of those resources may not be fully utilized, or may not be utilized exactly all the same way. Forget about measuring the power consumption of individual LUTs, BRAM or whatever. Design to make use of a large number of them, measure, and divide.
Obviously measure at different clock rates too.
Do not forget to think about temperature. Depending on resource use and clock rate, the die temperature may rise significantly, with a definite impact on current draw. So I suggest either adding a cooler of some kind, or at least monitoring the chip temperature and logging it along with your current measurements.