For sure, do what you need to that best works for your application - everyone has different needs.
Hello,
these are true words.
But it is an illusion that you can keep out all EMI-sources even with the best metal housings
if you have a wide open door i.e. the reference negative line.
(it makes no difference if the positive reference line is buffered or not).
The best chokes have around 10 dB EMI reduction. (perhaps up to 20 dB if you have luck and the right frequency).
A capacitor easyly dampens > 20 dB if the wires are kept short.
So If you can switch off all EMI-sources during a measurement, can use shielded transformers which are hard to get in single quantities then its the best solution for you. But I fear most hobby volt-nuts do not have a shielded EMI-cabinet with multiple stage filters for the power supply.
So my needs are clear:
- I do not want to have different output values in my "lab" independent of the gear that I or my neighbour is using.
- I also do not want to have different readings when I take my references into a unknown environment e.g. for calibration.
This is an area where theory ends and and reality begins.
So what do we have:
- no official documents from LT (no application note, no design note)
- no official published paper
- no measurement values nor a test setup to verify the story
On the other side:
I have recorded the ageing from my first 2 references over more than 6 years
there is only unusual ageing against other published papers of LTZ1000
if I short the output of the unbuffered reference.
-> Shi(f)t happens if you are working.
So what you describe (if it really exists) can only be a 2nd order effect.
with best regards
Andreas
Andreas:
Have you ever heard of an NDA? Non Disclosure Agreement. You have to sign those when you work in the industry. That's why I can't go into extreme detail here. I am not a hobbyist, I make my living making sure high performance semiconductor devices perform to spec long after we're all long gone and forgotten. From manufacturing to packaging to final application.
At this end we've been helping our customers build longevity into devices for over 30 (35?) years, across hundreds of LTZ's for our own custom test gear - and that know how also goes into billions of devices you use every day - and if you build the LTZ circuit correctly and shield it correctly it will work without glitches, because that is how they have always worked for us - at least that's how they should work in spirit and in application.
Extra caps or AZ amps are not required nor desired, but you do what you need to do. I apologize that I can't share detailed data publicly regarding advanced die aging processes because that R&D is at the -great- expense to our customers, and I've already taken some heat trying to offer aid here on a public forum. Obviously I should not have done that in your eyes. Obviously the manufacturer doesn't know what they are doing either after millions of devices and centuries of man-hours testing - so why should anyone take LT's advice over yours?
Most of what I have learned comes from working with LT and National Semiconductor and HP/Agilent/Keysight and Avago and Broadcom and TI and General Instrument and Siliconix and Fairchild and xxx, xxx, xx directly over the years, person to person...not a datasheet, not a college textbook written by some inexperienced PhD who never built a PN junction from sand in the industry. It comes from working hand's on directly with the people in the lab: learning from the current device processes + customer test feedback to make the next process even better. If that sounds like some story...OK, I understand.
Even if you don't believe me, have some faith there is a great deal going on inside the LTZ die (and similar structures) that you're not aware of . There are several interesting proprietary methods to measure internal current-induced strain / stress waves traveling across the die... and how that affects the die crystal physics down the road. All I can offer you in a very condensed, non-datasheet rule of thumb for buried zeners: If you want the die to be as stable as possible 5 / 10 / 20 yrs from now, then keep the current flow
as quiet as possible. To that end good engineering practice doesn't call for adding low-impedance caps or AZ amps across a buried zener structure IF there are other methods available. As I pointed out before: If there is no other way to add appropriate sheilding then add the caps! Add the AZ amps!! Whatever you like!!
Of course you can't control your neighbors, so that might limit what you can do for low ppm measures.
My intent is only to pass along some tid-bit information on how it's done in the real world. EEVblog is a great forum for that. I try to give you what little I can share here, and believe me or not - there is a ton of information here but that is about 1/10 of 1% of the iceberg tip of some of the strange effects we see when you start working directly with the die.
I understand a hobbyist has budget restraints, but that means you get creative and learn. Take an old box with non-working gear, strip out the guts and make that a Vref housing for testing. Learn how to track down EMI and defend against it. Wind your own transformer for instance if you can't buy one - or remove one from some other piece of gear. Learn how balanced chokes work and you can build those also - if you learn what/where your EMI is coming from you can build a very good defense for it, and usually at not a lot of cost. You can wind wire around a form, right? OF COURSE you can filter/ choke the positive AND negative power leads!! OF COURSE buffering the output helps keep out noise. Even better: for noisy environments deliver a differential output by driving both the + and - output lines, , use FORCE and SENSE techniques, etc. At least that's been our long experience and all of those things work for us when required.
In other words, if you're going to build a Vref like a 732a/ b, then build it like you mean business for low ppm - within the means of your budget of course. Do what you have to, but I wouldn't give advice for circuit changes that might not be best approach until more robust shielding methods are tried.
Over n' Out. Have fun folks! Sorry if I've offended anyone here with advice & tips that has kept our equipment running to spec for some 30+ years, including LTZ's.