I'm sharing with you the realization of a very small probe inspired by the CT-6 tektronix in terms of form factor.
The probe was designed to measure crystal drive levels but BTW we can measure anything else like mosfet gate drive current or any type of measurement requiring a really small probe in the <100mA range.
The main goal is to measure the drive level using a current probe like the AN-830 explained Figure 1 :
https://www.renesas.com/en/document/apn/830-quartz-crystal-drive-level?srsltid=AfmBOop9F-hQOzeEjaKozB6p6m6hfijKkWmu828jqtUFeVQD4wPCHuMjSimilar way at Murata :
https://www.murata.com/en-global/products/timingdevice/crystalu/overview/basic/drivelevelI used a B64290P0036X830 core 5 turns of AWG26, a 49.9R and an SMA. Everything else was made in-house.
The mini_probe_skeleton.zip contain only the CAD file in Solidworks format (.sldprt) of the plastic part. Only an SLA or SLS printer can be used for such a small part like that one. The printer used was an Halot Mage Pro with a layer height of 30um just for information.
The plastic part itself measure 5.6mmx10mm with 0.4mm wall.
Assembly of the probe :

Poting with the same resin as the used one for the printer :

Final assembly :

The probe measures with +/-3% accuracy up to 100MHz and has a bandwidth of ~700MHz (-3dB) with a sensitivity of 4mV / mA.
VNA result:

Doing a rapid test on an EVK.
In this example the crystal was a LFXTAL011301 from IQD FREQUENCY PRODUCTS.
As we can see in the Datasheet the max Drive Level is 500uW and the ESR is 40Ω.
According to the formula give by Murata :
Drive level = I² ・R1 -> (3.521*10-3)² * 40 = 495uW


Some measurements with a scope and a test jig :
Test jig :


C1 : Injected signal to the two 50ohm load (one in termination for the scope and the other one on the test jig itself)
C3 : The raw value (in V) measured by the scope from the current probe
F1 : The C3 value rescale in mA to match the 4mV/mA
