Good morning eeVblog fans
I am new to your forum but I have always been curious about all technology. Recently I have been learning a lot about designing devices and I decided to try to design something of my own.
A problem that you have probably seen hundreds of times but I cannot find the answer to it on the "big internet"
That's enough introduction.
When designing a device using an RJ45 port with a built-in transformer and POE taps, I encountered a problem that I am unable to maintain the 1.5kV isolation standard between the sides. I do not understand why the manufacturer created a connector that does not meet these IEC 60950-1:2001 standards.
According to what I have read, there are two test methods
a) 1500 Vrms steady-state at 50-60 Hz for 60 seconds, applied as specified in subclause 6.2 of IEC60950-1:2001.
b) An impulse test consisting of a 1500 V, 10/700 μs waveform, applied 10 times, with a 60 second interval between pulses, applied as specified in subclause 6.2 of IEC 60950-1:2001.
The connector model is BEL SI-52003-F
I have marked the place I have concerns about in blue on the attachment. The gap between the connections is close to 1 mm
that is not enough to meet IEC standards.
According to what I have read, there should be at least 2 mm there.
To sum up, I have two more questions.
1) What should I do to maintain IEC standards?
2) If I cut a gap in the place of the "LED" pins so that they hang in the air and the gap is >2 mm, will it then comply with the standards? Not everything can be solved this way, but this is the only idea I have.
3) Am I right that there should be at least 2mm between the POE pins and the system side (I'm attaching a photo of IEC62368 which shows that there should be at least 1.8mm for 1500V)
4) I know that there are people among you who have been designing for decades so how do you deal with such problems? Are there any good practices?
Thank you for any help.
If I didn't add the topic to the correct section, I apologize.
Best regards HVManiacc