One of the advantages of an RTD is a linear increase in resistance, which is easy to calculate. But hey, if you feel you must use a table lookup, continue reading.
I've used table lookups for an NTC based thermometer. A table was given in the NTC datasheet with temperature->resistance values in 5K increments. I converted the resistance values to expected ADC values, then stored those in the EEPROM. I only stored the ADC values, not the temperatures themselves, because they can be trivially reconstructed:
adcValues[0] = ADC value for -55°C
adcValues[1] = ADC value for -50°C
adcValues[2] = ADC value for -45°C
...
adcValues[41] = ADC value for 150°C
You get the idea.
The code then searches through the eeprom values for an interval where the measured ADC value is in between two values in the table, then does a linear interpolation between them, using this code:
for (i = 0; i < (ADC_VALUES_SIZE - 1); ++i, temperature += 50) {
int16_t a = adcValues[i];
int16_t b = adcValues[i + 1];
if (adcMeasurement == a) { return temperature; }
if (adcMeasurement < b) {
return temperature + 50 * (adcMeasurement - a) / (b - a);
}
}
Note 1: I use 50 instead of 5 because I'm working with tenths of a degree.
Note 2: The comparison is < b because an NTC's resistance drops with increasing temperature; for an RTD it's the other way round.