Note that a chip component doesn't have lumped ESL and EPC and whatever, it has transmission line characteristics.
Down in the 50ps regime, even this distinction matters.
Corollary, everything you do must necessarily be done in a transmission line, with respect to its impedance, and accounting for any stub lengths, unterminated reflections, etc.
This is why I suggested a filtering approach over a conventional slew limiting approach. Yes, as noted elsewhere, it will have a limited range, so needs to be done in multiple sections to cover the requested span. That's not too terrible, I think; good RF switches exist. Granted, I'm not sure the stub lengths in the filter itself, or in the switches, can even be low enough to get a good result.
Generating the initial edge rate, and verifying operation with a suitable probe and scope, are separate matters entirely.
It's just not a good problem, and all of this is damn good reason to question how/why it's a problem in the first place.
Tim