Hello,
I've recently scored a Fluke 185 which displays "Uncal" every time I turn it on.
Testing accuracy, some measurements seem to be close to expected value, but not all.
I pinged Fluke support and they told me the message indicates "an internal memory error".
This seems to be confirmed by the rather time warped last calibration date of 77/9977 the meter is showing (MM/YYYY format).
Looking at the meter's board layout and using the nice details in the review post here
https://www.eevblog.com/forum/testgear/fluke-185-review/msg578824/#msg578824and particularly this picture

I went ahead and desoldered the EEPROM IC (an ST M95160W).
Reading its contents with my trusty TL866 programmer several times, I got the same binary data on every occasion.
Assuming the calibration data, including the last cal date, are stored on the EEPROM IC, this means that either the actual contents of the IC have somehow been corrupted, or the contents are fine, but the main IC cannot read it from the EEPROM correctly (or at all).
So, my next step in the troubleshooting process was to re-solder the EEPROM IC back in its place and probe some of its pins during the startup of the meter:
- pin 1 - Chip select (active low)
- pin 2 - Serial data output (active high)
- pin 5 - Serial data input (active high)
- pin 6 - Serial clock (active high)
Please note the "active low" detail for pin 1 above.
If I now look at the single capture from my scope, I see the data in the screenshots attached ("one.png" is the overall capture, "two.png" is a zoom into one of the areas of interest, "three.png" is further zooming into an area of interest).
And, if my interpretation is correct, this looks like, at some point in the startup sequence, chip select is disabled (i.e. pin 1 is high) when data is being sent in and out of the EEPROM IC.
Is this normal behaviour?
Thanks!