| Products > Test Equipment |
| High failure rate of Maxim Integrated DS1245YP-100 chips on TDS7000 scopes |
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| Jwalling:
--- Quote from: Kjelt on March 22, 2017, 11:05:01 am ---You blame Maxim but you should blame Tek for using that part that has a fixed lifetime of 10 years after production till failure and they did it on purpose because they want you to buy a new scope by then and trash the old ones. It is this short term environment unfriendly production way of thinking that is to blame IMO. --- End quote --- Err... You don't get it. This is the snap-cap version with a replaceable battery, not the PDIP part. And these are semiconductor failures, not the battery in any case. More failures are documented here: https://www.eevblog.com/forum/testgear/tek-csa7404-repair-project/msg884291/#msg884291 https://www.eevblog.com/forum/testgear/tek-csa7404-repair-project/msg984925/?topicseen#msg984925 https://www.eevblog.com/forum/testgear/tek-csa7404-repair-project/msg572469/?topicseen#msg572469 When the new part comes in and I remove the old one I'll take a picture of the old chip. |
| wraper:
--- Quote from: Jwalling on March 23, 2017, 10:27:27 am --- --- Quote from: Kjelt on March 22, 2017, 11:05:01 am ---You blame Maxim but you should blame Tek for using that part that has a fixed lifetime of 10 years after production till failure and they did it on purpose because they want you to buy a new scope by then and trash the old ones. It is this short term environment unfriendly production way of thinking that is to blame IMO. --- End quote --- Err... You don't get it. This is the snap-cap version with a replaceable battery, not the PDIP part. And these are semiconductor failures, not the battery in any case. --- End quote --- BIG difference... :-DD. Either way your scope fails, data lost. Actually they are worse, you can easily pull out the DIP part from the socket and clone it. No such luck with snap-cap SMT parts. |
| Jwalling:
--- Quote from: wraper on March 23, 2017, 10:38:45 am --- --- Quote from: Jwalling on March 23, 2017, 10:27:27 am --- --- Quote from: Kjelt on March 22, 2017, 11:05:01 am ---You blame Maxim but you should blame Tek for using that part that has a fixed lifetime of 10 years after production till failure and they did it on purpose because they want you to buy a new scope by then and trash the old ones. It is this short term environment unfriendly production way of thinking that is to blame IMO. --- End quote --- Err... You don't get it. This is the snap-cap version with a replaceable battery, not the PDIP part. And these are semiconductor failures, not the battery in any case. --- End quote --- BIG difference... :-DD. --- End quote --- Yes, it is. :palm: --- Quote from: wraper on March 23, 2017, 10:38:45 am ---Either way your scope fails, data lost. Actually they are worse, you can easily pull out the DIP part from the socket and clone it. No such luck with snap-cap SMT parts. --- End quote --- You can't do SMT rework? :-DD It's actually easier to replace the SMT part. You don't have to remove the PPC board from the scope. |
| wraper:
--- Quote from: Jwalling on March 23, 2017, 10:46:38 am ---You can't do SMT rework? :-DD --- End quote --- SMT rework is easy. But you cannot pull them out to clone or backup contents unlike those in DIP package. And battery will fail in either case, sooner or later. BTW, my guess is, you, probably, had not done even 1/10 of SMT rework I've done, including large BGA, micro BGA. |
| Jwalling:
--- Quote from: wraper on March 23, 2017, 10:48:59 am --- --- Quote from: Jwalling on March 23, 2017, 10:46:38 am ---You can't do SMT rework? :-DD --- End quote --- SMT rework is easy. But you cannot pull them out to clone or backup contents unlike those in DIP package. And battery will fail in either case, sooner or later. BTW, my guess is, you, probably, had not done even 1/10 of SMT rework I've done, including large BGA, micro BGA. --- End quote --- :=\ You're probably right. I usually delegate that sort of work. ::) |
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