I want them to have a test hook instead of a crocodile clip.
My years old solution was to use grabbers with leads to connect the probe reference lead to and preserve it as intact.
Why would that not suit ?
Full story from 2014 however I'd built these a few years before:
Grabbers
A few ideas to stimulate thought......
This post refers only to low frequency general fault finding and testing.
While scope hook probes are great, there
will be times when they just won't do the job.
Soldering test wires to the DUT can be OK occasionally, but time consuming and frustrating if there are several POI.
If you are working on SMD, then you must use other methods to connect.
I use Tek grabbers, relatively cheap and versatile, but be mindful of their 40 V max rating.
They seem fine for all the SOIC work I have done.
They have 25 thou pins and one can easily knock up a selection of leads, with a tinned loop.
Have a rummage through your junk pile for wire with the right connectors, knock the shells off and shrink sleeve.
To have enough for a 4 Ch scope you would want 5 as a minimum IMO.
And if you have more POI's then you could knock up a little test probe header like this.
This one is from cheap grabbers off eBay, good quality wire and the header from a 10 mm thick mains switchboard off-cut. Each cable is finished in a loop and glued in a hole, and recessed for safety. The hole is large enough to accommodate a scope hook probe or the reference (GND) lead clip.
If I built another, I would use better grabbers and white nylon/plastic for the header to better display the grabber colors that were put on with a Sharpie or highlighter.