Products > Test Equipment
SSA3032X-R AVG100 Scectra of LiteVNA64
markus_jlrb:
Dears,
sorry to raise this issue, but If I'm not made a serious error I have some
observations that someone could verify to confirm or decline.
While playing with a SSA3032X-R by measuring some output spectra of
a LiteVNA64, I observed some irregularity in the AVG100 trace measurement.
First of all I was thinking this is an issue of the LiteVNA but after verifying the
center and span parameters I attached a second LiteVNA (last pic) and found
the same irregularity at the AVG100 trace measurement.
Would be nice if someone of the Siglent guys could comment on this findings.
Thanks in advance for your help and effort.
Markus
kladit:
Similiar observation here.
The displayed noise at the lower frequency side is visible higher than at the higher frequency side.
Not so pronounced as in your example, but visible.
Source here is my frequency standard, an OCXO, used as external reference.
I suppose this noise distributon is not from the OCXO.
Analyzer is an SSA3075X-R, firmware 3.2.2.6.0R7.
Hope other users will check and report their findings.
kladit:
I looked the signal of my OCXO with my scope and found I have measured the rectangular output of
my OCXO by mistake.
Attached is the measurement with the sinus output now, which looks much better.
I assume the differences were caused by the transient response of the filters in the analyzer to square waves.
Does your LiteVNA output sinus or rectangular signals?
I assume rectangular signals.
markus_jlrb:
Thanks kladit for your effort of verification.
Indeed my VNA output at lower frequencies is square shaped.
I will check with a sinus formed signal generated by my SDG6022X
to verify your findings.
Keep you informed on the result.
Thanks
Markus
markus_jlrb:
Sorry to report the same observation with a sin input at the SAS30kX-R FE.
10MHz at 1Vpp + 13dB passive ATT at SSA input channel and AVG100 Trace view.
Any ideas whats wrong?
Markus
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