After the scope has capture multiple copies of the trigger event plus one screen width of data around trigger point, I can SEARCH the captured data using different 'trigger condition' to find some abnormal events, right? For example, pulse abnormally higher voltage; some has RUNT
Even better: the always active history stores the trigger events for you without the need for you to do anything for it. Up to 80000 trigger events (depending on timabase and memory depth) can be stored in the history and inspected to your hearts content afterwards. All the tools are available and a couple advanced triggers are supported for event search, which works across the history if so desired. Compared to Sequence mode, history is just not as fast and there is no guaranteed max. dead time (down to 2 µs!), which is still sufficient in many use cases.
Many thanks for vast number of tests as in
https://www.eevblog.com/forum/testgear/sds800x-hd-review-demonstration-thread/msg5293741/#msg5293741Part one report shows the scope can capture pulse of two to four ns (presumably depends on 1,2 or 4 ch, at 2, 1 and 0.5MSa/s) and SPI decode at tens of time higher than my 10MHz task-on-hand.
Is the software
'practically' no bug for normal use? Any reason not to buy this (apart from 2000 series has the new serial test mode that measures dozen SPI signal parameters automatically, bigger screen and build-in LA)?