Products > Test Equipment
The Siglent SDG1000 and SDG800 thread
dexters_lab:
same waveform in pulse mode, the trace looks the same at all frequencies
Groucho2005:
--- Quote from: dexters_lab on September 24, 2015, 10:17:05 am ---same waveform in pulse mode, the trace looks the same at all frequencies
--- End quote ---
Thanks. So, less noise but more overshoot. Confirms the measurements done by rf-loop.
rf-loop:
--- Quote from: dexters_lab on September 24, 2015, 08:10:35 am ---
--- Quote from: ivan747 on September 24, 2015, 02:21:05 am ---
Can you try to replicate the square wave jitter issue? Congrats on the acquisition! May it last a long, productive life.
--- End quote ---
scope screenshots attached, infinite persistence & long memory for about 5 mins each on my DS1152
all measured at Square, 5vP-P 2.5v Offset, 50% duty.
i dont see any issues like in the traces detailed in the glitching thread
though the low part (at 0v) does look a bit noisy at the lower frequencies, my other older scope (a 50mhz digital/CRO) is blind to it
--- End quote ---
How these images tell anything about pulse or square function produced waves jitter (if we talk time jitter).
Even if you mesure it so that it is trigged to example risning edge and then you look next rising edge. There you can see cycle-cycle time jitter + test equipment itself jitter(s).
For better than this method there need be one signal what jitter is known and amount of jitter is so small that it not meaningful. Exept if really know that test equipment itself jitters are enough low.
Square wave noise before rising and before falling edge is other case and it can see also like this even with DS1000E (in this case when this noise is like it is now).
Overshoots and preshoots etc before and after edges - who know what is made by scope and test setup and what is really made by device under test.
dexters_lab:
--- Quote from: rf-loop on September 24, 2015, 11:09:33 am ---
How these images tell anything about pulse or square function produced waves jitter (if we talk time jitter).
Even if you mesure it so that it is trigged to example risning edge and then you look next rising edge. There you can see cycle-cycle time jitter + test equipment itself jitter(s).
For better than this method there need be one signal what jitter is known and amount of jitter is so small that it not meaningful. Exept if really know that test equipment itself jitters are enough low.
Square wave noise before rising and before falling edge is other case and it can see also like this even with DS1000E (in this case when this noise is like it is now).
Overshoots and preshoots etc before and after edges - who know what is made by scope and test setup and what is really made by device under test.
--- End quote ---
indeed there are many things at play with both source and measurement
the cycle-cycle jitter seems to be bang on spec at 8ns for pulse
the SDG1000 seems to be excellent value for money IMO, but it is always good to know the limitations of your equipment!
ivan747:
Wow, your unit behaves quite nicely.
Sent from my XT1063 using Tapatalk
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