As I had never used the testing method Huntron showed myself, and as I happened to have about 30 bad capacitors lying on the bench after a recently restored Panasonic NV-370 videorecorder, I figured why not give it a shot.
Unlike Huntron I didn't test in-circuit (after all, they had already been removed from the device after being judged defect), and from negative to case. That the tests weren't done in-circuit doesn't matter as we always isolate the caps by testing them on their floating case.
First time I used/experimented with this method (inspired by this thread), but it appears the Huntron-test is indeed valid: it was quite simple to discern good from bad ones.
For example, a bad 33u/10V capacitor with an ESR=17 ohm. The first image shows measured from - to +: a vertical ellipse: (all images 2V/div horizontal; 0.5mA/div vertical)
[ Specified attachment is not available ]
(hm, can't seem to post this image in-line? Anyway, it's still attached at the end of the post; it's not really very relevant for the method at hand, but just illustrates the difference testing pin-to-pin vs. pin-to-case)
But measuring from - to case shows a horizontal-ish ellipse:

Clearly a bad capacitor, as had already been previously established about a week ago using just the ESR-tester
This is what a good 10u/25V capacitor looks like (measuring negative to case):

A bad 10uF/16V cap with ESR=190 ohm:

A bad 33u/25V cap with ESR=44 ohm:

A bad 47u/6.3V cap with ESR=80 ohm:

Compared to a similar but good 47u/6.3V cap:

As can be seen, the difference is remarkable.
The method requires some experience correctly interpreting the results, but the very bad capacitors are easy to spot: horizonal line = very bad. I've so far always relied on my homebuilt ESR-tester, but will definitely use my Huntron-ish homebuilt device in the future too! I'll be testing a few more known good capacitors tonight to be able to better interpret the results. But I'm impressed so far.