I need a greybeard to help regarding Long Term Drift. If this is the wrong forum, I apologize, since using my Google-Fu I found the below topic:
https://www.eevblog.com/forum/metrology/ltc6655b-long-term-drift/The papers below make a very explicit statement that the Arrhenius Equation cannot be used to extrapolate Long Term Drift of a voltage reference. This is a little unsatisfying, as I would like to know
why this is the case. The reasoning in the papers below is that the Arrhenius Equation provides erroneous results, "results are too good and not possible."
https://www.maximintegrated.com/en/design/technical-documents/app-notes/7/7009.htmlhttps://www.analog.com/media/en/reference-design-documentation/design-notes/dn229f.pdfhttps://www.analog.com/media/en/technical-documentation/tech-articles/lt-journal-article/LT1461_1199_Mag.pdfTI's paper continues with discussing the actual setup, but does not outright state the Arrhenius Equation is erroneous.
https://www.ti.com/lit/pdf/sbaa436A blog post from TI discusses references, but clearly states the use of the Arrhenius Equation:
https://e2e.ti.com/blogs_/archives/b/precisionhub/posts/ic-long-term-stability-the-only-constant-is-changeI do not doubt the wisdom of the ancients with the greyest of beards; however, can someone help provide additional insight? Extrapolating ignores package curing effects? Package stress on the die? Electromigration (doubtful)? I will leave my questions, somewhat open ended.
1. Does LTD only apply to voltage references? Does it matter if it's a bandgap, buried zener?
2. If we have more complicated circuits like op-amps, integrated window-comparators, DCDC voltage specs that will drift over time, is the Arrhenius Equation still not applicable?
3. Why does there appear to be an inconsistency (especially from TI) where the Arrhenius Equation can be applied?
4. STFU, kid. Go back to your VR Chat.