I'm starting to have second thoughts about the "self" aspect of self-heating, when it comes to chips that weren't designed for it.
Everybody has heard of thermal gradients across integrated circuits, but just how bad can they really get in practice? Well, with AD588 and its three fully independent opamps on one die we can try to find out
The picture below shows location of the small signal (temperature sensing) and output (heat generating) stages of A2, A3, A4.
I used the following test conditions:
- single supply, 15V to be safe with short circuits to ground
- all amplifiers wired as buffered thermometers: unity gain and IN+ open circuit (too lazy too ground them for a quick test)
- outputs optionally shorted to ground (50mA current, 13V dropped inside the IC → 650mW) or loaded with 100Ω (18mA, 13V → 230mW)
In quiescent state, differences between the outputs of different amplifier are a few mV and quite stable.
A4 dissipating 230mW: A2, A3 difference increases 3.5mV or 0.5°C
A4 dissipating 650mW: A2, A3 difference increases 11mV or 1.5°C
A2 dissipating 650mW: A3, A4 difference increases 2mV or 0.3°C
After removal of load from the output, the difference returns to normal very fast, "feels" like the time constant is less than 1s. I think it's a sign that this is indeed a result of thermal gradient, rather than something innocent like different thermal coefficient in each amplifier.
Notably, A2 input stage is located just next to the buried zener, which means that the offset above represent a realistic drift of A3 temperature wrt zener temperature when the far end of the die varies its dissipation.
At last, we can take a quick glance at how true self-heated zener ICs deal with thermal gradients.
LTZ1000 - symmetric reference structure surrounded by a circular heater
LM399 - heater along one edge, all temperature critical bits including heater sensor arranged in one equidistant row
There we go. There was probably a reason for that. Damnit.