characterization

[chario]

Maybe this is just my experience, but characterization workflows seem far more fragmented than the measurements themselves.

The bench setup is usually rigorous. Everything after the capture tends to be a chain of exports, scripts, spreadsheets, and reports.

Is that just the state of the world, or have people found better ways to keep everything connected?

[free_electron]

If you are talking characterization of semiconductors : Send to excel, massage , plot.
The issue is that every device is different and thus requires different approach.
Data collected is exported as CSV. For Example a mosfet:
<Temp><Id><Vgs><Igs><Vds>

Companies have collections of pre-crafted excel sheets. Drop in the data and the plots appear. Tools like autohotkey can be used to batch process the import of collected data ( for example : measured 100 devices). Excel can plot waterfalls.