What do you think for whom and why does the respected madires wasting his precious time and write detailed instructions(manual) in which he considers all the nuances of measuring resistors, capacitances, inductances and other details? I think for those who want to explore the possibilities of the project, and not just for themselves.
... the socket will rattle with use
oitar, it is likely that ADC scaling is not working properly. Therefore, I propose several options for further action:
1. Remove capacitor C1 and repeat measurements without it. Does anything change?
2. Compile a new firmware, where the PA6 port will be assigned to measure the zener diodes. Apply external voltage(necessarily through a resistor divider) in the same way as you did before and check the response of this port.
3. You can try to upload firmware 1.13k.

3. Haven't had a chance to check 1.13k yet.
I have noticed a battery charge graphic at the bottom on some photos in this thread, looked in config.h but can't see the option to enable it
2. Done, similar results to the original port. In fact that's what I did earlier, using the "Battery Votage" testing pin. They all have a problem with voltages below 1V(at the pin).
Yesterday I ordered another unit which just might contain the ATmega324. These things are cheap enough that I'll keep at it until I get the one I want!
Call me a sucker for punishment, but after recently failing with my purchase of the LCR-TC2 from this vendor (I wanted an ATmega324 but got the LGT8F328P), I've taken a gamble on the LCR-TC1 model from the same vendor. https://www.aliexpress.com/item/1005004717377243.html
What gives me hope?QuoteLCR-T7 / LCR-TC1:color screen / M644 chip, two functions are the same! T7 is slightly faster! The TC1 screen is slightly larger and they are all powered by lithium batteries. In addition to measuring resistance, capacitance, inductance, diodes, MOS transistors, thyristors, it can also measure additional voltage regulators, infrared decoding (limited to for Hitachi format)
Self test with automatic calibration
In the LCR-TC2 description, it does not mention M644 (since it was delivered with LGT8F328P that makes sense) nor does it mention "Self test with automatic calibration" - this also makes sense as firmware for the LGT8F328P (in my case V3.1e) cannot fit the code for self-calibration. V3.1E firmware is also horrifically buggy, cannot reliability measure ESR, or Darlington transistors, etc. I will definitely be modifying my LCT-TC2 with LGT8F328P to the ATmega328P.
I can only presume (hope) M644 mentioned in the details of the LCR-TC1 description refers to ATMega644 and so far this is the only specific mention of M644 within an advertisement that I can find. Lets see when it arrives.
Luke
! In the future, I will try to convert the TC2 with its LGT8F328P to a MEGA328.I feel like I am walking in your footsteps![]()
). I was wondering maybe someone has already had this issue and could give me some hint to do further troubleshooting.My question may have already been answered, but at least I didn't manage to find it in the last couple of days that I'm reading through this thread (10 years old thread, really impressive). I was wondering maybe someone has already had this issue and could give me some hint to do further troubleshooting.
/* ************************************************************************
* workarounds for some testers
* ************************************************************************ */
/*
* Disable hFE measurement with common collector circuit and Rl as
* base resistor.
* - problem:
* hFE values are way too high.
* - affected testers:
* Hiland M644 (under investigation, possibly poor PCB design)
* - uncomment to enable
*/
#define NO_HFE_C_RLI can't seem to find any hardware problems on the probe side of the chip.
...
Any ideas welcome at this point because I'd like this particular unit to be running the latest M firmware, not K.
Unmodified (but working) LCR- units with APT32F172K8T6 MCU and the poorly designed U7 circuit will display 5-8V “zener voltage” with the 1k resistor connected to K-A. This is because DC-DC converter U7 actually does function as a constant current source (until it gets damaged).
The tester is rock-solid stable with 1.13k firmware, but with 1.49m sometimes it shows 0pF between probes during self-test while other times is the usual 47-51pF.
I can't seem to find any hardware problems on the probe side of the chip.
...
Any ideas welcome at this point because I'd like this particular unit to be running the latest M firmware, not K.Compare the Show Values with the photo to see if there are significant differences.
The tester is rock-solid stable with 1.13k firmware, but with 1.49m sometimes it shows 0pF between probes during self-test while other times is the usual 47-51pF.
0 pF can happen when some values don't add up during the measurement. You could try ADC_LARGE_BUFFER_CAP to increase the delay for switching the ADC's reference voltage.